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Electron Diffraction and Microscopy Studies of the Structure of Grain Boundaries in Al 2 O 3
Author(s) -
CARTER C. B.,
KOHLSTEDT D. L.,
SASS S. L.
Publication year - 1980
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1980.tb09848.x
Subject(s) - grain boundary , diffraction , crystallite , electron diffraction , materials science , foil method , crystallography , condensed matter physics , electron backscatter diffraction , electron microscope , enhanced data rates for gsm evolution , optics , microstructure , chemistry , composite material , physics , telecommunications , computer science
Electron diffraction and weak‐beam imaging techniques were used to examine the structure and thickness of grain boundaries in polycrystalline Al 2 O 3 . Extra diffraction spots from boundaries inclined to the foil surface were detected and related to the periodic structure of the boundary. Relrods from edge‐on boundaries were detected and used to estimate the thickness of the boundary region, i.e. the depth that the displacement field of the boundary penetrates into the two crystals adjacent to the interface.