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SIMS Analysis of Aqueous Corrosion Profiles in Soda‐Lime‐Silica Glass
Author(s) -
GOSSINK R. G.,
GREFTE H. A. M.,
WERNER H. W.
Publication year - 1979
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1979.tb18793.x
Subject(s) - secondary ion mass spectrometry , corrosion , soda lime , aqueous solution , materials science , ion , soda lime glass , analytical chemistry (journal) , mineralogy , metallurgy , chemistry , composite material , chromatography , organic chemistry
In secondary ion mass spectrometry (SIMS) of glasses compensation of surface charging is necessary to avoid migration of mobile ions. A charge‐compensation method, involving a metal diaphragm placed on the sample surface and a rastered primary ion beam, was tested on aqueous corrosion profiles in 20Na 2 O·10CaO·700SiO 2 (mol%) glass. The method was effective with both O − and O 2 + primary ions.