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High‐Resolution Techniques and Application to Nonoxide Ceramics
Author(s) -
CLARKE DAVID R.
Publication year - 1979
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1979.tb09477.x
Subject(s) - microstructure , sialon , ceramic , silicon nitride , materials science , silicon , resolution (logic) , high resolution , nitride , mineralogy , metallurgy , optoelectronics , composite material , nanotechnology , computer science , chemistry , geology , remote sensing , layer (electronics) , artificial intelligence
The microstructure of ceramic materials can be observed directly at the atomic level by using high‐resolution electron microscopy. These techniques are described in detail and the new information that they reveal about ceramic microstructures is illustrated with examples of hot‐pressed silicon nitrides, sintered silicon sarbide, and a “sialon” system.