z-logo
Premium
Anomalous Stress Profiles in Ion‐Exchanged Glass
Author(s) -
SANE A. Y.,
COOPER A. R.
Publication year - 1978
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1978.tb09328.x
Subject(s) - stress (linguistics) , materials science , tension (geology) , plane stress , composite material , photoelasticity , plane (geometry) , layer (electronics) , finite element method , ion , optics , geometry , chemistry , mathematics , thermodynamics , ultimate tensile strength , physics , solid mechanics , philosophy , linguistics , organic chemistry
Photoelastic measurements on specimens sliced from ion‐exchanged slabs and cylinders have revealed a tension maximum in the distribution of the axial stress. This maximum is not predicted by the conventional stress analysis, which assumes a plane stress condition and ignores the existence of an additional characteristic distance, the thickness of the exchanged layer. A 2‐dimensional finite element analysis under a generalized plane strain condition showed that a tension maximum in the axial stress occurs if the thickness of the slice from the plate is neither smaller than the layer thickness nor much greater than the plate thickness.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here