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Anomalous Stress Profiles in Ion‐Exchanged Glass
Author(s) -
SANE A. Y.,
COOPER A. R.
Publication year - 1978
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1978.tb09328.x
Subject(s) - stress (linguistics) , materials science , tension (geology) , plane stress , composite material , photoelasticity , plane (geometry) , layer (electronics) , finite element method , ion , optics , geometry , chemistry , mathematics , thermodynamics , ultimate tensile strength , physics , solid mechanics , philosophy , linguistics , organic chemistry
Photoelastic measurements on specimens sliced from ion‐exchanged slabs and cylinders have revealed a tension maximum in the distribution of the axial stress. This maximum is not predicted by the conventional stress analysis, which assumes a plane stress condition and ignores the existence of an additional characteristic distance, the thickness of the exchanged layer. A 2‐dimensional finite element analysis under a generalized plane strain condition showed that a tension maximum in the axial stress occurs if the thickness of the slice from the plate is neither smaller than the layer thickness nor much greater than the plate thickness.