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Heat Transfer in VO‐MO (M = Ni, Co, Mn) Solid Solutions
Author(s) -
MURANEVICH A. KH.
Publication year - 1978
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1978.tb09294.x
Subject(s) - solid solution , thermal conductivity , mean free path , analytical chemistry (journal) , phonon , materials science , manganese , lattice constant , semiconductor , electron transfer , conductivity , chemistry , condensed matter physics , electron , metallurgy , diffraction , composite material , physics , optoelectronics , chromatography , quantum mechanics , optics
The thermal conductivity of VO‐MO (M = Ni, Co, Mn) solid solutions was studied at 100° to 1100°K. In semiconductor compounds V 0.96 Ni 0.05 O, V 0.95 Co 0.05 O, and V 0.95 Mn 0.05 O, at >500°K, the electron thermal conductivity (increasing with temperature) was established using the Wiedemann‐Franz relation. The magnitude of the phonon mean free path, as evaluated for some compounds, is close to the lattice constant, indicating that phonons are strongly scattered by structural defects.