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Phase Relations and Thermal Expansion in the System HfO 2 ‐TiO 2
Author(s) -
RUH ROBERT,
HOLLENBERG G. W.,
CHARLES E. G.,
PATEL V. A.
Publication year - 1976
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1976.tb09416.x
Subject(s) - thermal expansion , materials science , analytical chemistry (journal) , differential thermal analysis , phase (matter) , titanate , hafnium , melting point , atmospheric temperature range , diffraction , mineralogy , lattice constant , thermodynamics , composite material , metallurgy , chemistry , zirconium , optics , ceramic , physics , organic chemistry , chromatography
The system HfO 2 ‐TiO 2 was investigated in the 0 to 60 mol% TiO 2 region using X‐ray diffraction analysis, differential thermal analysis, melting‐point studies, and dilatometry. For samples quenched from 1500° and 1250°C, single‐phase HfTiO 4 is present ∼36 to 53% TiO 2 , with HfO 2 coexisting as a second phase below 36% TiO 2 and TiO 2 coexisting as a second phase above 53% TiO 2. Room‐temperature lattice parameters of the hafnium titanate phase decreased linearly with composition for samples quenched from 1500°C and furnace‐cooled from 1600°C. High‐temperature lattice parameter studies confirmed the expansion anisotropy of the hafnium titanate phase in the single‐phase region. Linear thermal‐expansion measurements revealed very low coefficients (< 1 × 10 −6 /°C) for compositions in the 30 to 40% TiOs range and relatively high coefficients (∼4× 10 −6 /°C) for the 25, 45, 50, and 60 mol% TiO 2 compositions. The low expansion was attributed to microcracking.