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Analysis of Grain‐Boundary Impurities and Fluoride Additives in Hot‐Pressed Oxides by Auger Electron Spectroscopy
Author(s) -
JOHNSON W. C.,
STEIN D. F.,
RICE R. W.
Publication year - 1974
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1974.tb10918.x
Subject(s) - auger electron spectroscopy , grain boundary , impurity , materials science , spectroscopy , spinel , analytical chemistry (journal) , electron spectroscopy , metallurgy , inorganic chemistry , mineralogy , chemistry , microstructure , physics , organic chemistry , chromatography , quantum mechanics , nuclear physics
Auger electron spectroscopy was used to characterize grain‐boundary chemistry in MgO, Al 2 O 3 , and MgAl 2 O 4 (spinel) hot‐pressed with LiF or NaF. The presence of additives (F, Na) at the grain boundaries was confirmed; observation of grain‐boundary impurities in MgO extends previous studies.