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Diffusion in the System K 2 O‐SrO‐SiO 2 : IV, Mobility Model, Electrostatic Effects, and Multicomponent Diffusion *
Author(s) -
VARSHNEYA A. K.,
COOPER A. R.
Publication year - 1972
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1972.tb11325.x
Subject(s) - diffusion , ion , electric field , ionic bonding , flux (metallurgy) , thermodynamics , chemistry , valence (chemistry) , chemical physics , materials science , analytical chemistry (journal) , physics , organic chemistry , quantum mechanics , chromatography
Experimentally determined coefficients to describe multicomponent diffusion in the system K 2 O‐SrO‐SiO 2 are compared with predictions of a simple model assuming ideal solution behavior. The agreement is satisfactory overall. On the basis of this model, it is suggested that the differences in mobilities of various ions cause deviations from the condition Σ Z 4 j 4 =0 ( Z =valence, j =flux) of no space‐charge buildup. Although these deviations are small, e.g. after diffusion for 1 s, (charge flux)/(ionic flux) ≤ 10 −7 , the electric field caused by this deviation from electrical neutrality influences the diffusion kinetics markedly.