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Surface Domain Reorientation Produced by Abrasion and Annealing of Polycrystalline BaTiO 3
Author(s) -
CUTTER I. A.,
McPHERSON R.
Publication year - 1972
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1972.tb11304.x
Subject(s) - annealing (glass) , crystallite , materials science , perpendicular , recrystallization (geology) , diffraction , surface layer , crystallography , composite material , grain size , condensed matter physics , mineralogy , layer (electronics) , metallurgy , geometry , optics , geology , chemistry , mathematics , paleontology , physics
The abraded surface of polycrystalline BaTiO 3 was examined by X‐ray diffraction methods. The distorted layer produced by abrasion on 320‐grade SiC consists of (1) a region extending to the bottom of the deepest scratches in which the domains tend to be oriented with their c axes perpendicular to the surface and (2) a transition layer below this in which the orientation varies with depth. The orientation changes little on annealing until recrystallization begins at #900°C; however, annealing at 1100° to 1400°C produces an α‐domain reorientation. Possible explanations for these effects are discussed in terms of dislocations introduced by deformation during abrasion and grain size in the recrystallized surface layer.