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Electrical Resistance of Liquid Sulfur to 420°C and of Liquid Selenium to 700°C
Author(s) -
VEZZOLI GARY C.
Publication year - 1972
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1972.tb11210.x
Subject(s) - polymerization , electrical resistivity and conductivity , melting point , sulfur , selenium , vaporization , dissociation (chemistry) , electrical resistance and conductance , chemistry , depolymerization , softening point , degree of polymerization , materials science , semiconductor , analytical chemistry (journal) , polymer , polymer chemistry , thermodynamics , composite material , organic chemistry , physics , optoelectronics , electrical engineering , engineering
The electrical resistance of liquid sulfur was measured from just below the polymerization temperature to the vaporization point. Turning points in the resistance vs temperature curve, resulting presumably from polymerization and depolymerization, and a sharp decrease in resistance at 212°C agree well with previous results. Between ∼230° and 420°C, the resistance decreased without discontinuity. The resistance of selenium increased sharply by 3 orders of magnitude on melting and then decreased steadily by 5 orders of magnitude until the experiment was ended at 700°C. In both liquids, the electrical resistance as a function of temperature decreased more rapidly than that of an ideal intrinsic semiconductor whose molecular structure is stable over the temperature interval investigated. This rapid decrease is believed to result from chain dissociation and ring scission.