Premium
Detection and Measurement of Inhomogeneities in Glass by Small‐Angle Scattering of X Rays
Author(s) -
RUSSELL C. K.,
BERGERON C. G.
Publication year - 1965
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1965.tb14734.x
Subject(s) - electron micrographs , scattering , small angle scattering , materials science , silicate glass , particle size , small angle x ray scattering , silicate , particle (ecology) , optics , micrograph , mineralogy , scanning electron microscope , composite material , chemistry , electron microscope , physics , geology , oceanography , organic chemistry
Slope analyses of small‐angle scattering curves were used to determine the particle size of submicroscopic, immiscible regions in a lead silicate glass heat‐treated for various times at constant temperature. Particle‐size estimates made from electron micrographs indicated relatively good agreement between the two methods.