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Direct Examination of Ceramic Surfaces with the Scanning Electron Microscope
Author(s) -
THORNLEY R. F. M.,
CARTZ L.
Publication year - 1962
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1962.tb11187.x
Subject(s) - ceramic , scanning electron microscope , materials science , insulator (electricity) , electron microscope , surface (topology) , composite material , focus (optics) , mineralogy , optics , chemistry , geometry , physics , mathematics
A direct electron‐optical method of observing an insulator surface is described and applied to a series of alumina ceramics. The surface of the object requires no previous treatment of any kind, and a resolving power of 2000 A has been obtained with a depth of focus of about 50p. Different phases and components can be distinguished. Fractured surfaces, a fault region, and polished surfaces of various alumina ceramics are examined.