Premium
Determination of Percent Crystallinity of Partly Devitrified Glass by X‐Ray Diffraction
Author(s) -
OHLBERG S. M.,
STRICKLER D. W.
Publication year - 1962
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1962.tb11114.x
Subject(s) - crystallinity , diffractometer , materials science , scattering , diffraction , mineralogy , x ray crystallography , composite material , analytical chemistry (journal) , crystallography , optics , chemistry , scanning electron microscope , chromatography , physics
An X‐ray diffractometer method similar to one used to determine the crystallinity of stretched rubber has been applied to partly devitrified glass. Percent crystallinity is equated to 100(I g , – I x )/ (I g – I B ). I g , I x , I B are respectively the noncrystalline scattering intensities measured at a single value of 2θ for the parent glass (zero crystallinity), the partly devitrified glass, and a mechanical mixture of crystalline compounds chemically equivalent to the parent glass. The value of 2θ is selected such that the noncrystalline scattering is high for the parent glass and at the same time is free of crystalline scattering in the case of the partly devitrified glass and of the mechanical mixture. The assumptions and approximations inherent in the method are discussed and their validity is tested. The method is rapid, virtually independent of the crystalline species present, and accurate to ±5% or better.