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Principles of High‐Temperature Microscopy
Author(s) -
BRENDEN BYRON B.,
NEWKIRK H. W.,
BATES J. I.
Publication year - 1960
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1960.tb14592.x
Subject(s) - microscope , optical microscope , materials science , microstructure , microscopy , work (physics) , optics , composite material , mechanical engineering , scanning electron microscope , engineering , physics
An extensive summary of literature is presented which deals with (1) the design of microscope objectives suitable for high‐temperature work, (2) the design of high‐temperature microscope stages and furnaces, and (3) the problems of high‐temperature photomicrography. Designs of microscope systems of long working distance and with numerical apertures of 0 or greater are available and have been shown to be suitable for studying microstructures at temperatures above 750° C. Numerical apertures as low as 0.1 are suitable for the observation of specimens in image‐type furnaces and for the observation of macrostructures. Several types of excellent furnaces are available commercially.