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Determination of Resistivity of Lossy Materials from Dielectric Measurements, Making Use of Interfacial Polarization
Author(s) -
LEWIS ROBERT T.,
BICKFORD LAWRENCE R.
Publication year - 1956
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1956.tb15650.x
Subject(s) - electrical resistivity and conductivity , dielectric , materials science , relaxation (psychology) , condensed matter physics , activation energy , polarization (electrochemistry) , dielectric loss , cole–cole equation , mica , conductivity , debye , composite material , chemistry , optoelectronics , electrical engineering , physics , organic chemistry , psychology , social psychology , engineering
It is a well‐known fact that the phenomenon of interfacial polarization complicates dielectric measurements at low frequencies. This effect leads to a pseudo‐Debye relaxation process in a frequency or temperature spectrum of dielectric constant and loss, with the relaxation time determined by the physical dimensions of the barrier layer and by the resistivity of the bulk material. Use of this effect has been made to determine the resistivity of glass by purposely introducing a barrier of known dimensions, in the form of a thin sheet of mica. Values of resistivity and activation energy obtained by this method agree with values obtained by direct‐current measurements.