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QUANTITATIVE ANALYSIS OF CUBIC AND MONOCLINIC ZIRCONIA BY X‐RAY DIFFRACTION *
Author(s) -
Duwez Pol,
Odell Francis
Publication year - 1949
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1949.tb18946.x
Subject(s) - monoclinic crystal system , cubic zirconia , diffraction , materials science , x ray crystallography , powder diffraction , crystallography , x ray , calibration curve , calibration , analytical chemistry (journal) , mineralogy , optics , chemistry , crystal structure , physics , chromatography , composite material , ceramic , detection limit , quantum mechanics
A bstract The X‐ray diffraction technique presents a simple method for the quantitative analysis of mixtures of polymorphic forms of the same substance. The X‐ray spectrometer provides a rapid means for such work. In the case of zirconia, the relative intensities of the cubic (111) reflection and the monoclinic (111) and (111) reflections are related to the proportions of each form present. Details of the specimen preparation technique, instrument operation, and specific calibration curves are included.