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X‐RAY STUDY OF POTASH‐SILICA GLASS *
Author(s) -
Biscoe J.,
Druesne M. A. A.,
Warren B. E.
Publication year - 1941
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1941.tb14830.x
Subject(s) - potash , silicon , oxygen , mineralogy , materials science , ion , silicon dioxide , analytical chemistry (journal) , diffraction , potassium , chemistry , composite material , metallurgy , optics , environmental chemistry , physics , organic chemistry
A bstract X‐ray diffraction studies have been made of two samples of potash‐silica glass whose composition is 20.9% and 29.1% of K 2 O by weight. A Fourier analysis of the intensity curves indicates a structure similar to that found in soda‐silica glass. Each silicon is tetrahedrally bonded to 4 oxygen ions, with each oxygen bonded either to 1 or 2 silicons. The K + potassium ions are situated in holes in the silicon‐oxygen network with an average of about 10 oxygen neighbors.