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THE STRUCTURE OF SILICA GLASS BY X‐RAY DIFFRACTION STUDIES *
Author(s) -
Warren B. E.,
Biscce J.
Publication year - 1938
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1938.tb15742.x
Subject(s) - diffraction , tetrahedron , x ray crystallography , coordination number , small angle x ray scattering , scattering , materials science , silicon , crystallography , fourier transform , mineralogy , optics , chemistry , physics , mathematics , mathematical analysis , metallurgy , organic chemistry , ion
A bstract Three definite conclusions can be drawn from the X‐ray diffraction studies of vitreous silica. (1) The tetrahedral scheme of coordination, in which each silicon is tetrahedral surrounded by four oxygens and each oxygen shared between two silicons, is given directly by the Fourier analysis. (2) The liquid‐like continuity in the structure of glassy silica with no indication of discrete particles is given by the absence of small‐angle scattering. (3) If the diffraction pattern is explained by assuming small cristo‐balite crystals in the glass, calculations are made from the peak breadth that the particles can not be greater than about 8A. The random‐network theory of the structure of glass is in agreement with these experimental facts.