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Statistical characterization of TEM images of silica‐filled rubber
Author(s) -
TSCHESCHEL A.,
LACAYO J.,
STOYAN D.
Publication year - 2005
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.0022-2720.2005.01426.x
Subject(s) - natural rubber , dispersion (optics) , variogram , characterization (materials science) , materials science , composite material , cauchy distribution , polymer , matrix (chemical analysis) , transmission electron microscopy , filler (materials) , statistical analysis , mathematics , optics , statistics , physics , nanotechnology , kriging
Summary Transmission electron microscopy is used to study the micro‐dispersion of silica fillers within the polymer matrix of rubber. The resulting grey‐value images are interpreted as realizations of random fields and are characterized by means of variograms. The so‐called Cauchy class is a suitable model for this purpose. Statistical analysis shows that different filler dispersion properties are reflected in different variogram parameters. As a case study, the random field approach is demonstrated for four exemplary rubber compounds.