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Diffusion‐controlled reference material for VOC emissions testing: effect of temperature and humidity
Author(s) -
Liu Z.,
HowardReed C.,
Cox S. S.,
Ye W.,
Little J. C.
Publication year - 2014
Publication title -
indoor air
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.387
H-Index - 99
eISSN - 1600-0668
pISSN - 0905-6947
DOI - 10.1111/ina.12076
Subject(s) - relative humidity , toluene , humidity , diffusion , partition coefficient , volatile organic compound , analytical chemistry (journal) , environmental chamber , chemistry , atmospheric temperature range , mass transfer , environmental chemistry , environmental science , materials science , thermodynamics , chromatography , organic chemistry , physics
A polymethylpentene film loaded with toluene is being developed as a reference material to support the reliable measurement of volatile organic compound emissions from building materials using environmental chambers. Earlier studies included the measurement of the material‐phase diffusion coefficient ( D ) and material/air partition coefficient ( K ) at 23°C. A fundamental mass‐transfer model can then be used to predict toluene emissions from the reference material at 23°C, serving as a reference for validating chamber‐measured emission profiles. In this study, the effect of temperature and humidity on performance of the reference material was investigated. Reference material emissions were measured at 10, 23, and 30°C and at different relative humidity ( RH ) levels. D and K at different temperatures and RH were determined using an independent method. Results showed that RH does not significantly affect D and K and had no effect on emissions. However, emissions increased substantially at elevated temperatures due to the relationship between D and temperature. A statistical analysis shows good agreement between model‐predicted and measured gas‐phase concentrations, indicating that the model can accurately predict emission profiles as a function of temperature. The reference material can therefore be applied to a wide range of emission chamber testing conditions.