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Exploration of zinc borophosphate glasses as dispersion media for SiAlON phosphors
Author(s) -
Segawa Hiroyo,
Ohki Shinobu,
Deguchi Kenzo,
Shimizu Tadashi,
Hirosaki Naoto
Publication year - 2020
Publication title -
international journal of applied glass science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.383
H-Index - 34
eISSN - 2041-1294
pISSN - 2041-1286
DOI - 10.1111/ijag.15004
Subject(s) - phosphor , sialon , materials science , scanning electron microscope , raman spectroscopy , zinc , luminescence , crystallization , spectroscopy , dispersion (optics) , analytical chemistry (journal) , mineralogy , chemical engineering , nuclear chemistry , composite material , metallurgy , optics , chemistry , sintering , optoelectronics , organic chemistry , physics , quantum mechanics , engineering
Abstract Ca‐α‐SiAlON:Eu 2+ oxynitride phosphors are typical luminescent materials with high thermal tolerances. A series of zinc borophosphate glass samples (ZnO–B 2 O 3 –P 2 O 5 ) were prepared to investigate their ability to disperse Ca‐α‐SiAlON:Eu 2+ phosphor powders and to obtain phosphor‐in‐glass (PiG). PiG was prepared with SiAlON and zinc borophosphate glass through a melting process, and seven types of PiGs were successfully obtained without obvious degradation of SiAlON. In particular, PiGs prepared from 30ZnO–40B 2 O 3 –30P 2 O 5 and 60ZnO–30B 2 O 3 –10P 2 O 5 (mol%) glasses showed the highest quantum efficiency (QE). The glass structures of the mother glasses were investigated by nuclear magnetic resonance spectroscopy (NMR) and Raman spectroscopy; it was important to reduce the Q 0 species of PO 4 units and 4‐coordinate boron for a high QE. From the X‐ray diffraction (XRD) and scanning electron microscopy (SEM) images, it was established that ZnAl 2 O 4 was formed around the SiAlON powders in PiG composed of the 60ZnO–30B 2 O 3 –10P 2 O 5 (mol%) glass.