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Evaluation of the thermoluminescence kinetic parameters of zinc‐borosilicate glass after gamma‐irradiation
Author(s) -
Soliman Hala A.,
Salama Elsayed,
Youssef Gamal M.,
Hamad Sara
Publication year - 2018
Publication title -
international journal of applied glass science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.383
H-Index - 34
eISSN - 2041-1294
pISSN - 2041-1286
DOI - 10.1111/ijag.12287
Subject(s) - borosilicate glass , thermoluminescence , materials science , irradiation , zinc , kinetic energy , activation energy , deconvolution , analytical chemistry (journal) , doping , kinetics , radiochemistry , luminescence , optics , composite material , chemistry , optoelectronics , nuclear physics , metallurgy , physics , chromatography , quantum mechanics
Up until this moment, there was no detailed study concerning the kinetic parameters of zinc‐doped borosilicate glass thermoluminescent ( TL ) material. A significant TL peak was observed upon gamma irradiating the samples, at around 185°C. Evaluating activation energy (E), frequency factor (s), and order of kinetics (b) were conventionally obtained by peak shape ( PS ) method, repeated initial rise ( RIR ), and variable heating rate ( VHR ) methods. The obtained results indicated that the zinc‐doped borosilicate glass glow curve after gamma irradiation is legitimately a superposition of seven interfered glow peaks. Therefore, we cannot use computerized glow curve deconvolution ( CGCD ) method alone in determining the kinetic parameters in this case. Additive dose ( AD ), repeated initial raise ( RIR ), and variable heating rate ( VHR ) methods together with computerized deconvolution ( CGCD ) method by using the TolAnal software have been applied to determine the kinetic parameters of zinc‐borosilicate glass due to the existence of several nearby overlapped peaks. RIR method gives the value of ± 2.3% average variation, for the activation energies, compared with those obtained by GCDC . The obtained results clearly show the consequences reliability.