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Preparation and characterization of multilayer Gd2O2S:Tb phosphor screen for X‐ray detection application
Author(s) -
Li Wei,
Kou Huamin,
Zhang Wenhua,
Ge Lin,
Pan Hongming,
Hu Zewang,
Zhang Ying
Publication year - 2019
Publication title -
international journal of applied ceramic technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.4
H-Index - 57
eISSN - 1744-7402
pISSN - 1546-542X
DOI - 10.1111/ijac.13222
Subject(s) - phosphor , materials science , polyvinyl butyral , slurry , composite material , polyethylene glycol , layer (electronics) , optoelectronics , chemical engineering , engineering
Gd2O2S:Tb (GOS) phosphor screen, generally with a multilayer structure, has been widely used in digital X‐ray imaging. GOS phosphor screen is fabricated via a slip casting route, which is an effective method to obtain multilayer composites with good strength. The GOS slurry was prepared using the menhaden oil, polyvinyl butyral and PEG‐400 as dispersant, binder and plasticizer, respectively, and slip casted on a support layer. After the GOS scintillation layer is formed, a transparent polyethylene terephthalate film is covered on it as a protective layer. The X‐ray excited emission spectra of the obtained GOS phosphor screen is well match to the spectral response of a‐Si:H photodiode, and the spatial resolution was close to 3.7 LP/mm, which could meet the request of the commercial application.