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The Production and Characterization of Ytterbium‐Stabilized Zirconia Films for SOFC Applications
Author(s) -
Yildiz Esra,
Yilmaz Serdar,
Turkoglu Orhan
Publication year - 2015
Publication title -
international journal of applied ceramic technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.4
H-Index - 57
eISSN - 1744-7402
pISSN - 1546-542X
DOI - 10.1111/ijac.12406
Subject(s) - materials science , ytterbium , cubic zirconia , doping , scanning electron microscope , analytical chemistry (journal) , differential thermal analysis , slurry , diffraction , chemical engineering , mineralogy , composite material , optics , ceramic , chromatography , optoelectronics , chemistry , physics , engineering
(ZrO 2 ) 1– x (Yb 2 O 3 ) x binary systems were investigated in the doping range of 0.02 ≤ x ≤ 0.12. Ytterbium‐doped zirconia powders were synthesized using the Pechini method. X‐ray diffraction ( XRD ) measurements showed that fcc ZrO 2 was stabilized for 8–12 mol% Yb‐doping rate. The produced Yb‐stabilized Zr (Yb SZ ) films were characterized; their thickness and homogeneity properties depended on the nature of the Yb SZ slurry. All coating parameters were optimized and determined with precoating treatments. The samples were characterized by differential thermal analysis/thermal gravimetry ( DTA / TG ), scanning electron microscopy ( SEM ) and ac impedance measurements.