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Effective models for correlating spectral reflectance between spectrophotometers
Author(s) -
Xu Yang,
Luo M Ronnier,
Sun PeiLi,
Li Changjun
Publication year - 2013
Publication title -
coloration technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.297
H-Index - 49
eISSN - 1478-4408
pISSN - 1472-3581
DOI - 10.1111/cote.12046
Subject(s) - reflectivity , computer science , sample (material) , mathematics , algorithm , statistics , optics , chemistry , physics , chromatography
This paper describes different models to achieve satisfactory interinstrument agreement between spectrophometers. The models investigated include the Berns and Petersen method, the modified B erns and P etersen method, the R eniff method, the R ich and M artin method and the R ‐model developed by Chung et al . In the paper, the R eniff method and the R ‐model were extended, and all the models were then evaluated using sample sets with different substrates. It was found that the extended R eniff method gave the best training performance and the worst testing performance. The R ich and M artin model, the three‐term C hung model and the B erns and P etersen models, all with wavelength‐dependent coefficients, gave better testing performance.