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Measurement‐Based Synthesis of Facial Microgeometry
Author(s) -
Graham Paul,
Tunwattanapong Borom,
Busch Jay,
Yu Xueming,
Jones Andrew,
Debevec Paul,
Ghosh Abhijeet
Publication year - 2013
Publication title -
computer graphics forum
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 120
eISSN - 1467-8659
pISSN - 0167-7055
DOI - 10.1111/cgf.12053
Subject(s) - specular reflection , computer science , specular highlight , computer vision , reflectivity , artificial intelligence , optics , materials science , physics
We present a technique for generating microstructure‐level facial geometry by augmenting a mesostructure‐level facial scan with detail synthesized from a set of exemplar skin patches scanned at much higher resolution. Additionally, we make point‐source reflectance measurements of the skin patches to characterize the specular reflectance lobes at this smaller scale and analyze facial reflectance variation at both the mesostructure and microstructure scales. We digitize the exemplar patches with a polarization‐based computational illumination technique which considers specular reflection and single scattering. The recorded microstructure patches can be used to synthesize full‐facial microstructure detail for either the same subject or to a different subject. We show that the technique allows for greater realism in facial renderings including more accurate reproduction of skin's specular reflection effects.