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A semiparametric approach for item response function estimation to detect item misfit
Author(s) -
Köhler Carmen,
Robitzsch Alexander,
Fährmann Katharina,
Davier Matthias,
Hartig Johannes
Publication year - 2021
Publication title -
british journal of mathematical and statistical psychology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.157
H-Index - 51
eISSN - 2044-8317
pISSN - 0007-1102
DOI - 10.1111/bmsp.12224
Subject(s) - estimator , mathematics , parametric statistics , statistics , statistic , econometrics , item response theory , consistency (knowledge bases) , term (time) , psychometrics , physics , geometry , quantum mechanics
When scaling data using item response theory, valid statements based on the measurement model are only permissible if the model fits the data. Most item fit statistics used to assess the fit between observed item responses and the item responses predicted by the measurement model show significant weaknesses, such as the dependence of fit statistics on sample size and number of items. In order to assess the size of misfit and to thus use the fit statistic as an effect size, dependencies on properties of the data set are undesirable. The present study describes a new approach and empirically tests it for consistency. We developed an estimator of the distance between the predicted item response functions (IRFs) and the true IRFs by semiparametric adaptation of IRFs. For the semiparametric adaptation, the approach of extended basis functions due to Ramsay and Silverman (2005) is used. The IRF is defined as the sum of a linear term and a more flexible term constructed via basis function expansions. The group lasso method is applied as a regularization of the flexible term, and determines whether all parameters of the basis functions are fixed at zero or freely estimated. Thus, the method serves as a selection criterion for items that should be adjusted semiparametrically. The distance between the predicted and semiparametrically adjusted IRF of misfitting items can then be determined by describing the fitting items by the parametric form of the IRF and the misfitting items by the semiparametric approach. In a simulation study, we demonstrated that the proposed method delivers satisfactory results in large samples (i.e., N ≥ 1,000).