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The Use of Small‐Angle X‐Ray Diffraction Studies for the Analysis of Structural Features in Archaeological Samples
Author(s) -
Wess T. J.,
Drakopoulos M.,
Snigirev A.,
Wouters J.,
Paris O.,
Fratzl P.,
Collins M.,
Hillier J.,
Nielsen K.
Publication year - 2001
Publication title -
archaeometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.716
H-Index - 67
eISSN - 1475-4754
pISSN - 0003-813X
DOI - 10.1111/1475-4754.00007
Subject(s) - diffraction , x ray crystallography , synchrotron , materials science , parchment , scattering , scale (ratio) , scope (computer science) , crystallography , archaeology , optics , chemistry , geography , physics , computer science , cartography , programming language
X‐ray diffraction or scattering analysis provides a powerful non‐destructive technique capable of providing important information about the state of archaeological samples in the nanometer length scale. Small‐angle diffraction facilities are usually found at synchrotron sources, although the potential of a laboratory source is also described. Specific examples of analysis using X‐ray diffraction of historic parchment, archaeological bone, a Central Mexico style pictograph and microdiffraction of calcified tissues are used to show the scope and versatility of the technique. Diffraction data is capable of giving fundamental structural information as well as quantifying the remodelling of structures influenced by environmental factors.