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A Hierarchical Surface Measurement Strategy Using Non‐Repeating Patterns
Author(s) -
Zhou M.,
Fraser C. S.
Publication year - 2000
Publication title -
the photogrammetric record
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.638
H-Index - 51
eISSN - 1477-9730
pISSN - 0031-868X
DOI - 10.1111/0031-868x.00154
Subject(s) - photogrammetry , triangulation , pyramid (geometry) , computer vision , artificial intelligence , matching (statistics) , surface (topology) , computer science , metrology , structured light , surface metrology , point (geometry) , image (mathematics) , image matching , pattern recognition (psychology) , geography , mathematics , optics , surface finish , engineering , cartography , profilometer , geometry , physics , mechanical engineering , statistics
Hierarchical approaches for automated photogrammetric surface measurement invariably employ image pyramids and image matching at multiple resolutions. Such an approach is also applicable in industrial photogrammetry where projected light patterns are used to provide texture on an otherwise texture‐free surface. This paper describes a novel strategy for hierarchical surface measurement in which projected non‐repeating target patterns are employed, rather than the lower‐resolution levels of an image pyramid. Thus, although the final derived digital surface model is obtained by image matching, preliminary surface models which support the matching are obtained using the non‐repeating patterns. These projected patterns allow a simplification of the triangulation phase since they offer the potential of a fast and unambiguous solution to the image point correspondence problem. Following an introduction to the non‐repeating pattern strategy, integration of the approach into a multi‐camera vision metrology system is described and some experimental measurements are summarized