Open AccessEvaluation of Switching Loss Contributed by Parasitic Ringing for Fast Switching Wide Band-Gap Devices
Author(s) -
Zheyu Zhang,
Ben Guo,
Fei Wang
Publication year - 2018
Publication title -
ieee transactions on power electronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.159
H-Index - 266
eISSN - 1941-0107
pISSN - 0885-8993
DOI - 10.1109/tpel.2018.2883454
Subject(s) - ringing , parasitic extraction , switching time , parasitic element , commutation , transient (computer programming) , insertion loss , electrical engineering , fast switching , ground bounce , materials science , electronic engineering , voltage , engineering , computer science , transistor , filter (signal processing) , gate dielectric , operating system
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