Open AccessEvaluation of Switching Loss Contributed by Parasitic Ringing for Fast Switching Wide Band-Gap Devices
Author(s) -
Zheyu Zhang,
Ben Guo,
Fei Wang
Publication year - 2019
Publication title -
ieee transactions on power electronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.159
H-Index - 266
eISSN - 1941-0107
pISSN - 0885-8993
DOI - 10.1109/tpel.2018.2883454
Subject(s) - ringing , parasitic extraction , switching time , parasitic element , transient (computer programming) , commutation , insertion loss , materials science , ground bounce , fast switching , electrical engineering , electronic engineering , voltage , optoelectronics , engineering , computer science , transistor , filter (signal processing) , gate dielectric , operating system