Open AccessA Comprehensive Review Toward the State-of-the-Art in Failure and Lifetime Predictions of Power Electronic Devices
Author(s) -
Abu Hanif,
Yuechuan Yu,
Douglas DeVoto,
Faisal Khan
Publication year - 2018
Publication title -
ieee transactions on power electronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.159
H-Index - 266
eISSN - 1941-0107
pISSN - 0885-8993
DOI - 10.1109/tpel.2018.2860587
Subject(s) - reliability (semiconductor) , reliability engineering , physics of failure , computer science , power (physics) , power electronics , electronics , junction temperature , accelerated aging , electrical engineering , engineering , voltage , physics , quantum mechanics
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