Open AccessMultiscale Modeling of Total Ionizing Dose Effects in Commercial-off-the-Shelf Parts in Bipolar Technologies
Author(s) -
A. Privat,
Hugh Barnaby,
Philippe Adell,
B. S. Tolleson,
Y. Wang,
Xiaowen Han,
P. Davis,
B.G. Rax,
Thomas Edward Buchheit
Publication year - 2019
Publication title -
ieee transactions on nuclear science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.537
H-Index - 122
eISSN - 1558-1578
pISSN - 0018-9499
DOI - 10.1109/tns.2018.2887235
Subject(s) - commercial off the shelf , computer science , radiation hardening , ionizing radiation , bipolar junction transistor , electronic circuit , integrated circuit , process (computing) , radiation , transistor , electronic engineering , reliability engineering , electrical engineering , voltage , engineering , software , physics , operating system , quantum mechanics , irradiation , nuclear physics , programming language