Multiscale Modeling of Total Ionizing Dose Effects in Commercial-off-the-Shelf Parts in Bipolar Technologies | Zendy

A. Privat | Zendy; Hugh J. Barnaby | Zendy; Phillipe C. Adell | Zendy; B. S. Tolleson | Zendy; Yuzhuo Wang | Zendy; Xiaowen Han | Zendy; P. Davis | Zendy; B. R. Rax | Zendy; Thomas Edward Buchheit | Zendy

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Multiscale Modeling of Total Ionizing Dose Effects in Commercial-off-the-Shelf Parts in Bipolar Technologies

Author(s) -

A. Privat,

Hugh J. Barnaby,

Phillipe C. Adell,

B. S. Tolleson,

Yuzhuo Wang,

Xiaowen Han,

P. Davis,

B. R. Rax,

Thomas Edward Buchheit

Publication year - 2018

Publication title -

ieee transactions on nuclear science

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.537

H-Index - 122

eISSN - 1558-1578

pISSN - 0018-9499

DOI - 10.1109/tns.2018.2887235

Subject(s) - commercial off the shelf , computer science , radiation hardening , ionizing radiation , bipolar junction transistor , electronic circuit , integrated circuit , process (computing) , radiation , transistor , electronic engineering , reliability engineering , electrical engineering , voltage , engineering , software , physics , operating system , quantum mechanics , irradiation , nuclear physics , programming language

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