Open AccessTraining a Neural Network on Analog TaO<italic>x</italic> ReRAM Devices Irradiated With Heavy Ions: Effects on Classification Accuracy Demonstrated With CrossSim
Author(s) -
Robin Jacobs-Gedrim,
David Russell Hughart,
Sapan Agarwal,
György Vizkelethy,
Edward S. Bielejec,
B. L. Vaandrager,
Scot E. Swanson,
Kathrine E. Knisely,
J. L. Taggart,
Hugh J. Barnaby,
Matthew Marinella
Publication year - 2018
Publication title -
ieee transactions on nuclear science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.537
H-Index - 122
eISSN - 1558-1578
pISSN - 0018-9499
DOI - 10.1109/tns.2018.2886229
Subject(s) - resistive random access memory , ion , physics , computer science , artificial intelligence , electrode , quantum mechanics
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