Open AccessUsing MRED to Screen Multiple-Node Charge-Collection Mitigated SOI Layouts
Author(s) -
Jeanne T. Black,
Jeff A. Dame,
Dolores A. Black,
P.E. Dodd,
M.R. Shaneyfelt,
John Teifel,
Joseph G. Salas,
Robert Steinbach,
Michaël I. Davis,
Robert A. Reed,
Robert A. Weller,
James M. Trippe,
K.M. Warren,
Andrew M. Tonigan,
Ronald D. Schrimpf,
Richard S. Marquez
Publication year - 2019
Publication title -
ieee transactions on nuclear science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.537
H-Index - 122
eISSN - 1558-1578
pISSN - 0018-9499
DOI - 10.1109/tns.2018.2882944
Subject(s) - silicon on insulator , monte carlo method , insulator (electricity) , computer science , fabrication , node (physics) , event (particle physics) , electronic engineering , materials science , engineering , silicon , electrical engineering , physics , optoelectronics , mathematics , medicine , statistics , alternative medicine , structural engineering , pathology , quantum mechanics