Open AccessExperimental Investigation of Single-Event Transient Waveforms Depending on Transistor Spacing and Charge Sharing in 65-nm CMOS
Author(s) -
Mladen Mitrovic,
Michael Hofbauer,
Bernhard Goll,
Kerstin Schneider-Hornstein,
Robert Swoboda,
Bernhard Steindl,
Kay-Obbe Voss,
Horst Zimmermann
Publication year - 2017
Publication title -
ieee transactions on nuclear science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.537
H-Index - 122
eISSN - 1558-1578
pISSN - 0018-9499
DOI - 10.1109/tns.2017.2672820
Subject(s) - nuclear engineering , bioengineering
Single-event cross sections of four inverter chains, with uniform inverter spacing ranging from 120 nm to $4~\mu \text{m}$ , were experimentally measured and compared. These inverter chains were irradiated using a focused ion beam. Full analog waveforms of responses were sensed using on-chip wide-bandwidth analog multiplexers. Cross sections are examined with respect to pulse heights and pulse widths, for direct-hit waveforms as well as for waveforms propagated through the chain. The influence of ion hit position and charge sharing effects on the initial shape and propagation of the single-event transients (SETs) was analyzed. We have observed a considerable reduction of cross section for tightly spaced inverters, for both direct hits and propagated SETs.