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Reliability Enhancements in Memristive Neural Network Architectures
Author(s) -
Krishna Prasad Gnawali,
Bijay Raj Paudel,
Seyed Nima Mozaffari,
Spyros Tragoudas
Publication year - 2019
Publication title -
ieee transactions on nanotechnology
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.574
H-Index - 82
eISSN - 1941-0085
pISSN - 1536-125X
DOI - 10.1109/tnano.2019.2933806
Subject(s) - neuromorphic engineering , crossbar switch , backpropagation , reliability (semiconductor) , computer science , artificial neural network , process (computing) , overhead (engineering) , component (thermodynamics) , electronic engineering , chip , computer architecture , embedded system , engineering , artificial intelligence , telecommunications , power (physics) , physics , quantum mechanics , thermodynamics , operating system

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