Open AccessA 47 Million Pixel High-Performance Interline CCD Image Sensor
Author(s) -
Shen Wang,
Douglas A. Carpenter,
Adam DeJager,
James A. DiBella,
James E. Doran,
Robert P. Fabinski,
Andrew Garland,
James A. Johnson,
Ryan Yaniga
Publication year - 2015
Publication title -
ieee transactions on electron devices
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.828
H-Index - 186
eISSN - 1557-9646
pISSN - 0018-9383
DOI - 10.1109/ted.2015.2447214
Subject(s) - components, circuits, devices and systems , engineered materials, dielectrics and plasmas
A 47-million-pixel (47Mp) interline charge-coupleddevice (CCD) image sensor, the world's highest resolution interline-transfer CCD, has been developed for industrial, machine vision, and aerial photography applications. The sensor features a 5.5-μm pixel, 16-output low-noise amplifier and a lowsmear, fast-dump gate, horizontal lateral overflow drain, and ON-chip temperature sensor. One challenge to manufacture this large sensor is stitching the sensor with different lithography tools, while still achieving equal or better image performance than its predecessor.