Open AccessBreakdown phenomena across micrometer scale surface gap under negative voltage application
Author(s) -
Hiroyuki Iwabuchi,
Tsutomu Oyama,
Akiko Kumada,
Kunihiko Hidaka
Publication year - 2019
Publication title -
ieee transactions on dielectrics and electrical insulation
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.74
H-Index - 119
eISSN - 1558-4135
pISSN - 1070-9878
DOI - 10.1109/tdei.2019.007921
Subject(s) - cathode , materials science , field electron emission , micrometer , electric field , electrical breakdown , miniaturization , electrode , breakdown voltage , voltage , electron , optoelectronics , electrical engineering , nanotechnology , optics , chemistry , physics , dielectric , engineering , quantum mechanics
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