Diagnosis of Factors Impacting Yield in Multilayer Devices for Superconducting Electronics
Author(s) -
Nancy A. Missert,
Mark W. Jenkins,
Pai Tangyunyong,
William Mook,
I. V. Vernik,
A.F. Kirichenko,
Oleg A. Mukhanov,
Alex Wynn,
Alexandra Day,
Vladimir Bolkhovsky,
L. M. Johnson
Publication year - 2019
Publication title -
ieee transactions on applied superconductivity
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.467
H-Index - 84
eISSN - 1558-2515
pISSN - 1051-8223
DOI - 10.1109/tasc.2019.2908052
Subject(s) - microelectronics , materials science , electronics , optoelectronics , josephson effect , electronic circuit , fabrication , high temperature superconductivity , superconductivity , integrated circuit , electrical engineering , medicine , physics , alternative medicine , pathology , quantum mechanics , engineering
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