Open AccessAnalysis and Simulation of AC-Biased TES Circuits
Author(s) -
Tian-Shun Wang,
Jun-Kang Chen,
Xingxiang Zhou
Publication year - 2015
Publication title -
ieee transactions on applied superconductivity
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.467
H-Index - 84
eISSN - 1558-2515
pISSN - 1051-8223
DOI - 10.1109/tasc.2015.2470668
Subject(s) - fields, waves and electromagnetics , engineered materials, dielectrics and plasmas
We systematically study the analysis and simulation of ac-biased superconductor transition-edge sensor (TES) circuits. In these ac-biased circuits, the current and voltage of the TES experience large swings in both directions, and small-signal analysis around a dc steady state does not apply. To understand their electrical and thermal behavior, we rely on concepts and techniques from radio-frequency circuit simulation and introduce the periodic steady state and perform periodic ac analysis. We also construct TES device models based on a comprehensive two-fluid physical model and investigate the behavior of ac-biased TES circuits using advanced circuit simulators. By relating our findings to results for the analysis of dc-biased TES circuits, we give appropriate definitions for the current and temperature sensitivity of the TES in ac-biased circuits. Our work not only builds a rigorous foundation for theoretical analysis of ac-biased TES circuits but also introduces powerful simulation techniques valuable for their design and research.