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Measurement and Extraction of Parasitic Parameters of Quasi-Vertical Schottky Diodes at Submillimeter Wavelengths
Author(s) -
Souheil Nadri,
Linli Xie,
Masoud Jafari,
Matthew F. Bauwens,
Alexander Arsenovic,
Robert M. Weikle
Publication year - 2019
Publication title -
ieee microwave and wireless components letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.94
H-Index - 123
eISSN - 1558-1764
pISSN - 1531-1309
DOI - 10.1109/lmwc.2019.2918295
Subject(s) - gallium arsenide , schottky diode , diode , optoelectronics , materials science , wafer , equivalent circuit , parasitic element , wavelength , silicon , waveguide , optics , physics , electrical engineering , engineering , voltage

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