Open AccessRecovery of Cycling Endurance Failure in Ferroelectric FETs by Self-Heating
Author(s) -
Halid Mulaosmanovic,
Evelyn T. Breyer,
Thomas Mikolajick,
Stefan Slesazeck
Publication year - 2018
Publication title -
ieee electron device letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.337
H-Index - 154
eISSN - 1558-0563
pISSN - 0741-3106
DOI - 10.1109/led.2018.2889412
Subject(s) - temperature cycling , cycling , ferroelectricity , materials science , annealing (glass) , optoelectronics , field effect transistor , transistor , electrical engineering , voltage , composite material , thermal , engineering , physics , archaeology , meteorology , dielectric , history
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