Open AccessReliability of nand-Based SSDs: What Field Studies Tell Us
Author(s) -
Bianca Schroeder,
Arif Merchant,
Raghav Lagisetty
Publication year - 2017
Publication title -
proceedings of the ieee
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.383
H-Index - 287
eISSN - 1558-2256
pISSN - 0018-9219
DOI - 10.1109/jproc.2017.2735969
Subject(s) - general topics for engineers , engineering profession , aerospace , bioengineering , components, circuits, devices and systems , computing and processing , engineered materials, dielectrics and plasmas , fields, waves and electromagnetics , geoscience , nuclear engineering , robotics and control systems , signal processing and analysis , transportation , power, energy and industry applications , communication, networking and broadcast technologies , photonics and electrooptics
Solid-state drives (SSDs) based on NAND flash are making deep inroads into data centers as well as the consumer market. In 2016, manufacturers shipped more than 130 million units totaling around 50 Exabytes of storage capacity. As the amount of data stored on solid state drives keeps increasing, it is important to understand the reliability characteristics of these devices. For a long time, our knowledge about flash reliability was derived from controlled experiments in lab environments under synthetic workloads, often using methods for accelerated testing. However, within the last two years, three large-scale field studies have been published that report on the failure behavior of flash devices in production environments subjected to real workloads and operating conditions. The goal of this paper is to provide an overview of what we have learned about flash reliability in production, and where appropriate contrasting it with prior studies performing controlled experiments.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom