Open AccessNoise-Based Simulation Technique for Circuit-Variability Analysis
Author(s) -
Aristeidis Nikolaou,
Jakob Leise,
Jakob Pruefer,
Ute Zschieschang,
Hagen Klauk,
Ghader Darbandy,
Benjamin Iniguez,
Alexander Kloes
Publication year - 2020
Publication title -
ieee journal of the electron devices society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.69
H-Index - 31
ISSN - 2168-6734
DOI - 10.1109/jeds.2020.3046301
Subject(s) - components, circuits, devices and systems , engineered materials, dielectrics and plasmas
An accurate and efficient noise-based simulation technique for predicting the impact of device-parameter variability on the DC statistical behavior of integrated circuits is presented. The proposed method is validated on a source follower, a diode-load inverter and a current mirror based on organic thin-film transistors. Taking advantage of the standard noise analysis of a circuit, after translating the statistical variation of the electrical parameters of the transistors into equivalent-noise circuit components, the proposed technique yields results identical to those obtained from a Monte Carlo simulation, but in a significantly shorter amount of time.