Open AccessCircular Structure for High Mechanical Bending Stability of a-IGZO TFTs
Author(s) -
Mallory Mativenga,
Haeyeon Jun,
Younwoo Choe,
Jae Gwang Um,
Jin Jang
Publication year - 2017
Publication title -
ieee journal of the electron devices society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.69
H-Index - 31
ISSN - 2168-6734
DOI - 10.1109/jeds.2017.2751651
Subject(s) - components, circuits, devices and systems , engineered materials, dielectrics and plasmas
We employ a circular (Corbino) thin-film transistor (TFT) structure, in which the outer-ring is the drain and the inner-ring is the source, to improve the stability of amorphous-indium-gallium- zinc-oxide TFTs under tensile bending strain. We attribute the stability improvement to a more uniform electric field distribution across the circular channel, as it is isolated from local electric field crowding at sharp corners or channel edges. In addition, the effect of strain-induced increase in channel charge concentration is small in Corbino TFTs, owing to the larger outer-ring electrode, which depletes more electrons than the drain of rectangular TFTs. Furthermore, the circular shape results in bending direction independence, which is very important in multi-TFT circuits, where TFT orientation varies with position.