Open AccessStress-Driven Diffusive Voiding of Aluminum Conductor Lines
Author(s) -
F.G. Yost,
D. E. Amos,
A. D. Romig
Publication year - 1989
Publication title -
reliability physics
Language(s) - English
Resource type - Conference proceedings
ISSN - 0735-0791
DOI - 10.1109/irps.1989.363385
Subject(s) - conductor , void (composites) , materials science , stress relaxation , stress (linguistics) , wedge (geometry) , diffusion equation , mechanics , aluminium , boundary value problem , composite material , creep , mathematical analysis , mathematics , physics , geometry , engineering , philosophy , linguistics , metric (unit) , operations management
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