Open AccessExtraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits
Author(s) -
Lu Fu,
Zhaowen Yan,
Changshun Fu,
Donglin Su
Publication year - 2021
Publication title -
ieee access
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.587
H-Index - 127
ISSN - 2169-3536
DOI - 10.1109/access.2021.3125051
Subject(s) - aerospace , bioengineering , communication, networking and broadcast technologies , components, circuits, devices and systems , computing and processing , engineered materials, dielectrics and plasmas , engineering profession , fields, waves and electromagnetics , general topics for engineers , geoscience , nuclear engineering , photonics and electrooptics , power, energy and industry applications , robotics and control systems , signal processing and analysis , transportation
A new experimental research method on the electromagnetic susceptibility of integrated circuits (ICs) is proposed in this paper. This method is a new research topic based on seeking basic laws of chip electromagnetic susceptibility, aiming at providing an effective reference for chip electromagnetic compatibility (EMC) designers and users. Three different types of interference waveforms are used in the experimental process, in which the laws are analyzed and summarized by observing the experimental phenomena and results. The results indicate that the influence of various signal waveforms on the chip electromagnetic susceptibility presents certain regularity. The results also show that the influence of different chips on the electromagnetic susceptibility presents different characteristics under the same waveform interference. A large number of experiments have been carried out to derive the rules of chip electromagnetic susceptibility.