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Complete Modal Analysis of Planar Waveguide Junctions With a 2-D Hybrid FEM/Leontovich Framework Including Conductor Losses
Author(s) -
Hui Jiang,
Juan Corcoles,
Jorge A. Ruiz-Cruz
Publication year - 2025
Publication title -
ieee transactions on microwave theory and techniques
Language(s) - English
Resource type - Magazines
SCImago Journal Rank - 1.372
H-Index - 190
eISSN - 1557-9670
pISSN - 0018-9480
DOI - 10.1109/tmtt.2025.3614425
Subject(s) - fields, waves and electromagnetics
A scalar 2-D finite-element-method (FEM) framework is presented for planar waveguide junctions enclosed by a non-perfect conductor, considering its complete modal spectrum at its rectangular waveguide ports. Separate formulations are first derived for the general $\text {TM}^{z}$ and $\text {TE}^{z}$ modal excitations, which are combined through a modal basis transformation. Conductor losses are embedded through the Leontovich boundary condition with minimal overhead. One additional matrix is required for lateral-wall losses under $\text {TM}^{z}$ excitation, while two are needed under the more involved $\text {TE}^{z}$ excitation, for which specific vector test functions are introduced to maintain the scalar nature of the problem with lateral-wall losses. Lid-wall losses are captured by a perturbation method, leaving the algebraic stencil untouched. Because the analysis remains strictly 2-D, benchmarks on transformers, filters, bends, and diplexers demonstrate run-times noticeably shorter than 3-D FEM-based commercial software, while retaining full-wave accuracy.

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