Traceability of S-Parameter Measurements Up to 167 GHz Using 0.8 mm Coaxial Standards

To establish traceable S-parameter measurements in the 0.8 mm coaxial connector system, dimensional measurements are performed on a set of seven offset short standards. Reflection coefficients for each standard are calculated numerically and analytically based on these dimensions. S-parameter measurements are conducted for one-port devices up to 167 GHz, and an optimization-based calibration is applied, treating material properties as free parameters. Selected measurement results are presented, and associated uncertainty budgets are discussed.