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Traceable S-Parameter Measurements Up to 165 GHz Using 0.8 mm Coaxial Standards
Author(s) -
Andreas Schramm,
Frauke Gellersen,
Florian Rausche,
Karsten Kuhlmann
Publication year - 2025
Publication title -
ieee microwave and wireless technology letters
Language(s) - English
Resource type - Magazines
eISSN - 2771-9588
pISSN - 2771-957X
DOI - 10.1109/lmwt.2025.3562419
Subject(s) - fields, waves and electromagnetics
To extend SI-traceable calibration for coaxial measurements up to 165 GHz, seven calculable offset short standards in the 0.8 mm coaxial system are used. The standards are calculated based on dimensional measurements and used for an overdetermined least-squares calibration. Measurement results and uncertainty budgets are reported for a flush short and a broadband match. The repeatability of the interface and a minimal pin gap are investigated.

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